Wu, X; ; Luo, C; Hao, P; Sun, T; Wang, RS; Wang, CL; Hu, ZG; Li, YW; Zhang, J; ; Bersuker, G,Probing and Manipulating the Interfacial Defects of InGaAs Dual-Layer Metal Oxides at the Atomic Scale, ADVANCED MATERIALS, Vol. 30, No. 2, DOI: 10.1002/adma.201703025, JAN 11 2018
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